Department Publications

2020s

2020

1. Laser wavelength metrology with low-finesse etalons and Bayer filters

   J. Nicholas Porter^‡, Jarom S. Jackson^†, Dallin S. Durfee, and Richard L. Sandberg

   Opt. Express 28 (25), 37788-37797 (2020).
   

^‡Undergraduate Student Author

^†Graduate Student Author