Department Publications

2020s

2022

120. Tuning the index of refraction of a polyvinyl toluene and polystyrene copolymer toward a heterogenous, index-matched neutron detector

     Aaron J. Thorum^†, David D. Allred, William G. Pitt, and Troy R. Munro

     J. Appl. Polym. Sci. , e53305 (2022).
     
121. Carbon nanotube microfabricated window with extreme ultraviolet transmission and differential pumping

     Scott Olsen^†, Richard Vanfleet, David Allred, and Robert Davis

     UV and Higher Energy Photonics: From Materials to Applications 2022 (San Diego, CA, October 2022). Proc. SPIE 1220102, 1220102 (2022).
     
122. Evidence that evaporated Al/AlF₃ bilayer thin films stored in a 327 K oven for over 2500 hours have not degraded

     Kenan Fronk^‡ and David D. Allred

     SPIE Astronomical Telescopes + Instrumentation, 2022, (Montréal, Québec, Canada, August 2022). Proc. SPIE 12181, 121813A (2022).
     
123. Stability of lithium fluoride thin films as a function of humidity and temperature

     Tanner D. Rydalch^‡, Devin M. Lewis^‡, and David D. Allred

     SPIE Astronomical Telescopes + Instrumentation, 2022, (Montréal, Québec, Canada, August 2022). Proc. SPIE 12188, 121884M (2022).
     

2021

116. The future of plasmaspheric extreme ultraviolet (EUV) imaging

     J. Goldstein, D.L. Gallagher, B.R. Sandel, M. Davis, P. Molyneux, T. Veach, … D.D. Allred, and R.S. Turley (3 other authors)

     Chapter 6 in Understanding the Space Environment through Global Measurements, (Elsevier, 2022).
     
117. Oxidation of aluminum thin films protected by ultrathin MgF₂ layers measured using spectroscopic ellipsometry and X-ray photoelectron spectroscopy

     Brian I. Johnson^†, Tahereh G. Avval^†, R. Steven Turley, Matthew R. Linford, and David D. Allred

     OSA Continuum 4 (3), 879-895 (2021).
     

2020

114. Illuminating the degradation of lithium fluoride mirror coatings in humid environments

     Devin M. Lewis^‡, Caleb Michael Plewe^‡, Alexandra Gallion Stapley^‡, Joshua J. Vawdrey^‡, R. Steven Turley, and David D. Allred

     Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV, (Online, December 2020). Proc. SPIE 11451, (2020).
     
115. Retardation of the oxidation of aluminum thin films in low-oxygen and cryogenic environments

     S. Merlin Hart^‡, Donovan K. Smith^‡, and David D. Allred

     Advances in Optical and Mechanical Technologies for Telescopes and Instrumentation IV, (Online, December 2020). Proc. SPIE 11451, 788-800 (2020).
     
116. A carbon nanotube structure for an EUV window with differential pumping

     Scott Olsen^†, Richard Vanfleet, David Allred, Steve Turley, and Robert Davis

     Advances in X-Ray/EUV Optics and Components XV, (August 2020). Proc. SPIE 11491, 1149104-1 (2020).
     
117. Oxide structure of air-passivated U-6Nb alloy thin films

     Erik B. Watkins, Izabela Kruk, Jaroslaw Majewski, and David D. Allred

     J. Nucl. Mater. 539, 152356 (2020).
     
118. Thermal Properties of Thin Film Uranium Oxides and Thorium Oxides

     Aaron Thorum^‡, Logan Page^‡, Troy Munro, David Allred, Zilong Hua, and David Hurley

     Proceedings of the ASME 2019, International Mechanical Engineering Congress and Exposition, IMECE2019 (Salt Lake City, UT, November 2019).
     

2010s

2019

109. Optical constants of evaporated amorphous zinc arsenide (Zn₃As₂) via spectroscopic ellipsometry

     J. Colter Stewart^‡, Micah N. Shelley^‡, Nathan R. Schwartz^‡, Spencer K. King^‡, Daniel W. Boyce^‡, James W. Erikson^‡, David D. Allred, and John S. Colton

     Opt. Mater. Express 9 (12), 4677-4687 (2019).
     
110. Using ellipsometry and x-ray photoelectron spectroscopy for real-time monitoring of the oxidation of aluminum mirrors protected by ultrathin MgF₂ layers

     Brian I. Johnson^†, Tahereh G. Avval^†, Grant T. Hodges^‡, Victoria Carver^‡, Karen Membreno^‡, David D. Allred, and Matthew R. Linford

     Astronomical Optics: Design, Manufacture, and Test of Space and Ground Systems II, 111160O (San Diego, CA, September 2019). Proc. SPIE 11116, (2019).
     
111. Oxidation of Aluminum Protected by Wide Band Gap MgF₂ Layers as Followed by X-ray Photoelectron Spectroscopy

     Brian I. Johnson, Tahereh Gholian Avval, Grant P. Hodges, Karen Membreno, David D. Allred, and Matthew R. Linford

     Society of Vacuum Coaters, 2019 Technical Conference Proceedings, Optical Coatings (August 22, 2019).
     
112. Expanding the Far UV Range of Aluminum-Coated Mirrors for Space-Based Observations to Reflect Hydrogen Lyman Lines via Fluoride Multilayers

     David D. Allred, Leoul E. Tilahun, J. Gabriel Richardson^‡, and R. Steven Turley

     Optical Interference Coatings 2019, (Santa Ana Pueblo, NM, June 2019).
     
113. Y₂O₃ optical constants between 5 nm and 50 nm

     Joseph B. Muhlestein^‡, Benjamin D. Smith^‡, Margaret Miles^†, Stephanie M. Thomas^‡, Anthony Willey^†, David D. Allred, and R. Steven Turley

     Opt. Express 27 (3), 3324-3336 (2019).
     
114. Think First, Act Later - A Course Structure for Improving Student Designed Experiments

     Nathan D. Powers, Dallin S. Durfee, and David D. Allred

     2018 Conference on Laboratory Instruction Beyond the First Year of College, Part of the BFY Conference series, (Baltimore, MD, July, 2018).
     

2018

103. Optimization of Broadband Multilayer Mirror Reflectivity via a Genetic Algorithm

     Michael Greenburg^‡, David D. Allred, and R. Steven Turley

     Annual Conference of the Utah Academy of Sciences, Arts, & Letters (Orem, UT, April 2017). J. Utah Acad. Sci. 94, 317-325 (2018).
     

2017

102. Adding EUV reflectance to aluminum-coated mirrors for space-based observation

     David D. Allred, R. Steven Turley, Stephanie M. Thomas^‡, Spencer G. Willett^‡, Michael J. Greenburg^‡, and Spencer B. Perry^‡

     UV/Optical/IR Space Telescopes and Instruments: Innovative Technologies and Concepts VIII Proc. SPIE 10398, 34-01 (2017).
     
103. Formation of solid thorium monoxide at near-ambient conditions as observed by neutron reflectometry and interpreted by screened hybrid functional calculations

     Heming He, Jaroslaw Majewski, David D. Allred, Peng Wang, Xiaodong Wen, and Kirk D. Rector

     J. Nucl. Mater. 487, 288-296 (2017).
     
104. An inexpensive high-temperature optical fiber thermometer

     Travis J. Moore, Matthew R. Jones, Dale R. Tree, and David D. Allred

     J. Quant. Spectrosc. Radiat. Transf. 187, 358-363 (2017).
     

2015

99. High-Aspect-Ratio Metal Microfabrication by Nickel Electroplating of Patterned Carbon Nanotube Forests

    Lawrence K. Barrett^†, Dallin J. Barton^‡, Steven G. Noyce^‡, David D. Allred, Richard R. Vanfleet, and Robert C. Davis

    J. Microelectromech. Syst. 24 (5), 1331-1337 (2015).
    

2013

98. Determination of the Insulation Gap of Uranium Oxides by Spectroscopic Ellipsometry and Density Functional Theory

    Heming He, David A. Andersson, David D. Allred, and Kirk D. Rector

    J. Phys. Chem. C 117 (32), 16540-16551 (2013).
    

2012

97. Characterization of Chemical Speciation in Ultrathin Uranium Oxide Layered Films

    Heming He, P. Wang, D. D. Allred, Jaroslaw Majewski, M. P. Wilkerson, and Kirk D. Rector

    Anal. Chem. 84 (23), 10380-10387 (2012).
    
98. Effect of iron catalyst thickness on vertically aligned carbon nanotube forest straightness for CNT-MEMS

    Kellen Moulton^‡, Nicholas B. Morrill^‡, Adam M. Konneker^‡, Brian D. Jensen, Richard R. Vanfleet, David D. Allred, and Robert C. Davis

    J. Micromech. Microeng. 22 (5), 055004 (2012).
    
99. Fabrication and Testing of a Strain-Based Carbon Nanotube Magnetometer Structure

    J. A. Brame^‡, J. E. Goodsell^‡, S. A. Getty, Y. Zheng, and D. D. Allred

    J. Utah Acad. Sci. 88, 444-454 (2012).
    

2011

94. Measurement of the Imaginary Index of Refraction of UOx in the Extreme Ultraviolet

    Heidi M. Dumais^†, R. Steven Turley, and David D. Allred

    J. Utah Acad. Sci. 87, 255-265 (2011).
    
95. Polymer molded templates for nanostructured amorphous silicon photovoltaics

    Lei Pei^†, Amy Balls^‡, Cary Tippets^‡, Jonnathan Abbott^†, Matthew R. Linford, Jian Hu, … David D. Allred, Richard R. Vanfleet, and Robert C. Davis (1 other authors)

    J. Vac. Sci. Technol. A 29, 021017 (2011).
    

2010

92. Diode properties of nanotube networks

    Bryan Hicks^‡, Stephanie Getty, and David Allred

    Thin Solid Films 518 (17), 5014-5017 (2010).
    
93. Characterization of optical constants for uranium from 10 to 47 nm

    Nicole Brimhall^†, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

    Appl. Optics 49 (9), 1581-1585 (2010).
    

2000s

2009

90. Measured optical constants of copper from 10 nm to 35 nm

    Nicole Brimhall^†, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

    Opt. Express 17 (26), 23873-23879 (2009).
    
91. Effective Medium Theory, Rough Surfaces, and Moth's Eyes

    R. Steven Turley, David Allred, Anthony Willey^†, Joseph Muhlestein^†, and Zephne Larsen^‡

    J. Utah Acad. Sci. 86, 273-286 (2009).
    

2008

88. Eliminating carbon contamination on oxidized Si surfaces using a VUV excimer lamp

    Elisabeth (Liz) Strein^† and David Allred

    Thin Solid Films 517 (3), 1011-1015 (2008).
    
89. Eliminating adventitious carbon contamination on SiO2 using a UV excimer lamp

    E. Strein^†, D. Allred, and R. S. Turley

    Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
    
90. Nanoscale Characterization of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy

    Guillermo Acosta^†, Richard Vanfleet, David D. Allred, and R. S. Turley

    Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
    
91. Extreme-ultraviolet polarimeter utilizing laser-generated high-order harmonics

    Nicole Brimhall^†, Matthew Turner^‡, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

    Rev. Sci. Instrum. 79 (10), 103108 (2008).
    
92. Determining the refractive index in the extreme ultraviolet using Kramers-Kronig on thin-film scandium oxide transmission data

    Jacqualine Jackson Butterfield^† and David D. Allred

    J. Utah Acad. Sci. 85, 203-211 (2008).
    

2007

83. Thin-film iron-catalyzed "beads on a string" carbon nanotubes

    Jonathan Goodsell^†, Stephanie A. Getty, Jon Brame^‡, and David D. Allred

    J. Utah Acad. Sci. 84, 130-140 (2007).
    
84. Bounds and Conditions, A Kolob In Our Solar System

    David Allred

    Sunstone , (2007).
    
85. Strain-based Electrical Properties of Systems of Carbon Nanotubes Embedded in Parylene

    Jon Brame^‡, Stephanie Getty, Johnathan Goodsell^†, and David D. Allred

    2006 Materials Research Society Fall Meeting, (November 2006, Boston, MA). MRS Proc. 963, 0893-JJ05-09 (2007).
    

2006

80. Determining indices of refraction for ThO2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry

    William R. Evans^† and David D. Allred

    Thin Solid Films 515 (3), 847-853 (2006).
    
81. Simultaneous Reflection and Transmission Measurements from Coated Diodes to Determine the Optical Constants of Thin Films in the Extreme Ultraviolet

    D. D. Allred, G. A. Acosta^†, N. Farnsworth-Brimhall^†, and R. S. Turly

    Society of Vacuum Coaters, 2006 Technical Conference Proceedings, Optical Coating (April 2006, Washington, DC). Proc. SVC 2006, 314-325 (2006).
    
82. Thorium dioxide thin films in the extreme ultraviolet

    Nicole F. Brimhall^†, Amy B. Grigg^†, R. Steven Turley, and David D. Allred

    Proc. SPIE 6317, 631711 (2006).
    
83. Understanding DC-bias sputtered thorium oxide thin films useful in EUV optics

    William R. Evans^†, Sarah C. Barton, Michael Clemens^†, and David D. Allred

    Advances in X-Ray/EUV Optics, Components, and Applications, (August 2006, San Diego, CA).  Proc. SPIE 6317, 631711 (2006).
    
84. Intermediate Martian Atmospheric Study and Demonstration

    Donovan Chipman^‡, Andrew Ning^‡, and David Allred

    SpaceOps 2006 Conference, (June 2006, Rome, Italy)
    
85. PECVD growth of Six:Ge1-x films for high speed devices and MEMS

    Srinivasan Kannan, Craig Taylor, and David Allred

    J. Non-Cryst. Solids 352 (9-20), 1272-1274 (2006).
    
86. Thorium-Based Thin Films as Highly Reflective Mirrors in the EUV

    Jed E. Johnson^†, David D. Allred, R. Steven Turley, William R. Evans^†, and Richard L. Sandberg^‡

    2005 Materials Research Society Fall Meeting, Symposium JJ – Actinides 2005 – Basic Science, Applications and Technology, (November 2005, Boston, MA). MRS Proc. 893, 207-214 (2006).
    

2005

73. A Technique for Measuring the Thin Film Thickness of Ultrathin Metallic Thin Films, 4-20 nm, using Atomic Force Microscopy

    Guillermo Acosta^†, David D. Allred, and Robert C. Davis

    Summer 2005 SVC Bulletin , 34-38 (2005).
    
74. Determining Composition of Thin Films of Uranium Oxide by X-Ray Photoelectron Spectroscopy

    Kristi Adamson^‡, Shannon Lunt^†, Richard Sandberg^†, Elke Jackson^‡, David Allred, and R. Steven Turley

    J. Utah Acad. Sci. 82, 176-186 (2005).
    

2004

71. Determining ruthenium's optical constants in the spectral range 11-14 nm

    Luke J. Bissel^‡, David d. Allred, R. Steven Turley, William R. Evans^†, and Jed. E. Johnson^†

    Proc. SPIE 5538, 84-91 (2004).
    
72. Optical properties and application of uranium-based thin films for the extreme ultraviolet and soft x-ray region

    Richard L. Sandberg^†, David d. Allred, Shannon Lunt^†, Marie K. Urry^‡, and R. Steven Turley

    Proc. SPIE 5538, 84-91 (2004).
    
73. Uranium Oxide as a Highly Reflective Coating from 100-400 eV

    Richard L. Sandberg^†, David D. Allred, Luke J. Bissell^‡, Jed E. Johnson^†, and R. Steven Turley

    AIP Conf. Proc. 705, 796-799 (2004).
    
74. Removing Surface Contaminants from Silicon Wafers to Facilitate EUV Optical Characterization

    R. E. Robinson^‡, R. L. Sandberg^†, D. D. Allred, A. L. Jackson, J. E. Johnson^†, W. Evans^†, T. Doughty^‡, … K. Adamson^†, and A. Jacquier^† (1 other authors)

    47th Annual Technical Conference Proceedings, (Dallas, TX, April 2004), Vol. 47, (Society of Vacuum Coaters, Albuquerque, NM, 2004) 368-376.
    
75. A comparison of uranium oxide and nickle as single-layer reflectors from 2.7 to 11.6 nm

    Richard L. Sandberg^†, David D. Allred, Jed E. Johnson^†, and R. Steven Turley

    Proc. SPIE 5193, 191-203 (2004).
    

2003

66. What the Universe Means to People Like Me

    David D. Allred

    Dialogue 36, 110-125 (2003).
    

2002

65. Highly Reflective Uranium Mirrors for Astrophysics Applications

    David D. Allred, Matthew B. Squires^†, R. Steven Turley, Webster Cash, and Ann F. Shipley

    Proc. SPIE 4782, 212-223 (2002).
    
66. Mars Jars

    David Allred

    Fifth International Mars Society Conference, (August 2002, Boulder, CO).
    
67. The Optical Constants of Sputtered U and a Si at 30.4 and 58.4 nm

    M. B. Squires^†, David D. Allred, and R. Steven Turley

    J. Utah Acad. Sci. 76, 74-87 (2002).
    

2001

62. Design of bifunctional XUV multilayer mirrors using a genetic algorithm

    Shannon Lunt^†, R. Steven Turley, and David D. Allred

    J. X-ray Sci. Technol. 9, 1-11 (2001).
    

2000

61. The extreme ultraviolet imager investigation for the IMAGE mission

    B. R. Sandel, A. L. Broadfoot, C. C. Curtis, R. A. King, T. C. Stone, R. H. Hill, … D. D. Allred, R. S. Turley, … (4 other authors)

    Space Sci. Rev. 91 (1-2), 197-242 (2000).
    

1990s

1999

60. Dual-function EUV multilayer mirrors for the IMAGE mission

    David D. Allred, R. Steven Turley, and Matthew B. Squires^†

    Proc. SPIE 3767, 280-287 (1999).
    
61. Optical constants of sputtered U and a-Si at 30.4 and 58.4 nm

    Matthew B. Squires^†, David D. Allred, and R. Steven Turley

    Proc. SPIE 3767, 288-294 (1999).
    
62. A rotating electrochemical cell to prepare porous silicon with different surface structures

    R. Osorio-Saucedo, C. Vázquez-López, W. Calleja, D. D. Allred, and C. Falcony

    Thin Solid Films 338 (1-2), 100-104 (1999).
    

1997

57. Reactive Gas Magnetron Sputtering of Lithium Hydride and Lithium Fluoride Thin Films

    G. B. Thompson^‡ and D. D. Allred

    J. X-ray Sci. Technol. 7 (2), 159-170 (1997).
    

1996

56. Structural phase transition and T_c distribution in Hf-doped LaMnO₃ investigated using perturbed-angular-correlation spectroscopy

    Gary L. Catchen, William E. Evenson, and David Allred

    Phys. Rev. B 54 (6), R3679-R3682 (1996).
    
57. The Structure of W/C (0.15 < γ < 0.8) Multilayers Annealed in Argon or Air

    J. Gonzalez-Hernandez, B. S. Chao, S. R. Ovshinsky, and D. D. Allred

    J. X-ray Sci. Technol. 6 (1), 1-31 (1996).
    
58. Raman spectrographic system for quantitative analysis of isotopic hydrogen mixtures for muon catalysis experiments

    Steven E. Jones, David S. Shelton, R. Steven Turley, M. Jeannette Lawler, and David D. Allred

    Hyperfine Interact. 102, 695-698 (1996).
    

1995

53. Deconvolution of the Raman spectrum of amorphous carbon

    Qi Wang^†, D. D. Allred, and L. V. Knight

    J. Raman Spectrosc. 26 (12), 1039-1043 (1995).
    
54. Observation of beam-induced changes in the polarization of Balmer-α radiation emitted following beam-tilted-foil transmission

    Douglas L. Harper, Royal G. Albridge, Norman H. Tolk, Wang Qi^†, David D. Allred, and Larry V. Knight

    Phys. Rev. A 52 (6), 4631-4639 (1995).
    
55. Waterjet cutting of cross‐linked glass

    Fang Yuan^†, John A. Johnson^†, David D. Allred, and Robert H. Todd

    J. Vac. Sci. Technol. A 13 (1), 136 (1995).
    

1994

50. Emitted current instability from silicon field emission emitters due to sputtering by residual gas ions

    W. I. Karain^†, Larry V. Knight, David D. Allred, and A. Reyes-Mena

    J. Vac. Sci. Technol. A 12 (4), 2581 (1994).
    
51. Raman spectroscopic study of the formation of t‐MoSi2 from Mo/Si multilayers

    M. Cai^†, D. D. Allred, and A. Reyes-Mena

    J. Vac. Sci. Technol. A 12 (4), 1535 (1994).
    
52. Mesostructure of photoluminescent porous silicon

    F. Ruiz, C. Vázquez-López, J. González-Hernández, David D. Allred, G. Romero-Paredes, R. Peña-Sierra, and G. Torres-Delgado

    J. Vac. Sci. Technol. A 12 (4), 2565 (1994).
    

1993

47. Use of Raman spectroscopy in characterizing soft x-ray multilayers: tools in understanding structure and interfaces

    Ming Cai^†, Qi Wang^†, David D. Allred, Larry V. Knight, Dorian M. Hatch, Arturo Reyes-Mena, and Guizhong Zhang

    24th Annual Boulder Damage Symposium Proceedings -- Laser-Induced Damage in Optical Materials, (September 1992, Boulder, CO). Proc. SPIE 1848, 521 (1993).
    
48. The use of sharp silicon tips as photocathodes and electron sources for X-ray generation

    W. I. Karain^†, L. V. Knight, D. D. Allred, and A. Reyes-Mena

    Nanostruct. Mat. 3 (1-6), 419-424 (1993).
    
49. Photoluminescence and absorption studies of defects in CdTe and Zn_xCd_1-xTe crystals

    Cheryl Barnett Davis, David D. Allred, A. Reyes-Mena, J. González-Hernández, Ovidio González, Bret C. Hess, and Worth P. Allred

    Phys. Rev. B 47 (20), 13363-13369 (1993).
    
50. Low-frequency feature in the first-order Raman spectrum of amorphous carbon

    Qi Wang^†, D. D. Allred, and Jesus González-Hernández

    Phys. Rev. B 47 (10), 6119-6121 (1993).
    

1992

43. Using thin-film stress to produce precision, figured X-ray optics

    F. Yuan^†, Y. Shi^†, L. V. Knight, R. T. Perkins^†, and D. D. Allred

    Thin Solid Films 220 (1-2), 284-288 (1992).
    
44. Raman Spectroscopic Analysis of Mo/Si Multilayers

    David D. Allred, Ming Cai^†, Qi Wang^†, Dorian M. Hatch, and A. Reyes-Mena

    J. X-ray Sci. Technol. 3 (3), 222-228 (1992).
    
45. Multilayer phase diffraction gratings modeled as a structure in three dimensions

    Douglas P. Hansen ^†, Arturo Reyes-Mena , John R. Colton, Larry V. Knight, and David D. Allred

    Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (July 1992, San Diego, CA). Proc. SPIE 1742, 476 (1992).
    
46. X-ray diode using a silicon field-emission photocathode

    Wael I. Karain^†, Larry V. Knight, David D. Allred, and Arturo Reyes-Mena

    Soft X-Ray Microscopy, (July 1992, San Diego, CA). Proc. SPIE 1741, 12-18 (1992).
    
47. Manufacturing of atomically sharp silicon tips and their use as photocathodes

    W. I. Karain^†, Larry V. Knight, David D. Allred, and A. Reyes-Mena

    J. Utah Acad. Sci. 69, 257-272 (1992).
    
48. Characterization of as‐prepared and annealed W/C multilayer thin films

    J. Gonzalez-Hernandez, B. S. Chao, D. A. Pawlik, D. D. Allred, and Qi Wang^†

    J. Vac. Sci. Technol. A 10 (1), 145-151 (1992).
    

1991

37. Transmittances of thin polymer films and their suitability as a supportive substrate for a soft x-ray solar filter

    Memorie K. Williams^‡, Evan Hansen ^‡, Arturo Reyes-Mena, and David D. Allred

    EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy II, (July 1991, San Diego, CA). Proc. SPIE 1549, 147-154 (1991).
    
38. Advanced infrared optically black baffle materials

    Roland D. Seals, Charles M. Egert, and David D. Allred

    Optical Surfaces Resistant to Severe Environments, (July 1991, San Diego, CA). Proc. SPIE 1330, 164-167 (1991).
    
39. The effect of oxygen on the structure of annealed w/c multilayer thin-films

    S. S. Chao, D. A. Pawlik, J. González-Hernández, Qi Wang^†, and D. D. Allred

    Solid State Commun. 79 (3), 205-207 (1991).
    
40. Structure and optical characterization of Zn x Cd1−x Te thin films prepared by the close spaced vapor transport method

    J. González-Hernández, O. Zelaya, J. G. Mendoza-Alverez, E. López-Cruz, D. A. Pawlik, and D. D. Allred

    J. Vac. Sci. Technol. A 9 (3), 550-554 (1991).
    

1990

33. Diffuse absorbing beryllium coatings produced by magnetron sputtering

    Charles M. Egert and David D. Allred

    Proc. SPIE 1331, 170-178 (1990).
    
34. Photoluminescence studies in Zn x Cd1−x Te single crystals

    J. González-Hernández, Elías López-Cruz, D. D. Allred, and Worth P. Allred

    J. Vac. Sci. Technol. A 8 (4), 3255-3259 (1990).
    
35. Photoconductive characterization of Zn x Cd1−x Te (0≤x≤0.25) single crystal alloys

    Elías López-Cruz, J. González-Hernández, D. D. Allred, and W. P. Allred

    J. Vac. Sci. Technol. A 8 (3), 1934-1938 (1990).
    
36. Deposition of Zinc Selenide by Atomic Layer Epitaxy for Multilayer X-Ray Optics

    J. K. Shurtleff^†, D. D. Allred, R. T. Perkins^†, and J. M. Thorne

    Materials Research Society
    
37. Annealing Behavior of The Photoluminescence Lines in CdTe and Znx Cd1−x Te Single Crystals

    J. Gonzalez-Hernandez, A. Reyes-Mena, Elias Lopez-Cruz, D. D. Allred, and Worth P. Allred

    Materials Research Society
    
38. Characterization of Metal/Carbon Multilayers by Raman Spectroscopy

    David D. Allred, Qi Wang^†, and Jesus Gonzalez-Hernandez

    Materials Research Society
    

1980s

1989

27. Design Of High Performance Soft X-Ray Windows

    Raymond T. Perkins^†, David D. Allred, Larry V. Knight, and James M. Thorne

    X-Ray/EUV Optics for Astronomy and Microscopy, (July 1989, San Diego, CA).  Proc. SPIE 1160, 56-65 (1989).
    
28. Use Of Raman Spectroscopy In The Characterization Of Soft X-Ray Multilayer Reflectors

    Qi Wang^†, David D. Allred, L. V. Knight, and Jesus Gonzalez-Hernandez

    Proc. SPIE 1160, 229-234 (1989).
    
29. Multilayer X-Ray Optics Produced By Atomic Layer Epitaxy

    J. K .Shurtleff^†, D. D. Allred, R. T. Perkins^†, and J. M. Thorne

    Proc. SPIE 1159, 664 (1989).
    

1988

24. Accelerated Life Test for Thermoelectric Junctions: Solder Element Interactions

    David D. Allred and On Van Nbuyen

    Proceedings of the Seventh International Conference on Thermoelectric Energy Conversion
    

1987

23. Superconductivity at 155 K

    S. R. Ovshinsky, R. T. Young, D. D. Allred, G. DeMaggio, and G. A. Van der Leeden

    Phys. Rev. Lett. 58 (24), 2579-2581 (1987).
    
24. Anneal Induced Changes in Amorphous Semiconductor Multilayers

    J. Gonzalez-Hernandez, D. D. Allred, and O. V. Nguyen

    Materials Research Society
    

1986

21. Comparison Of Effective Medium Procedures For Optical Modeling Of Laminar Structures

    Robert F. Edgerton and David D. Allred

    Proc. SPIE 0821, 167-173 (1986).
    
22. A New Multiphase Thermoelectric Material for Power Generation

    O. V. Nguyen, David D. Allred, and S. R. Ovshinsky

    Sixth Internional Conference on Thermoelectric Energy Conversion, (March 1986, Arlington, TX).
    
23. Raman scattering and x-ray diffraction characterization of amorphous semiconductor multilayer interfaces

    D. D. Allred, J. Gonzalez-Hernandez, O. V. Nguyen, D. Martin, and D. Pawlik

    J. Mat. Res. 1, 468-475 (1986).
    

1985

18. Spectrally selective surfaces by chemical vapor-deposition

    David D. Allred, Michael R. Jacobson, and Elizabeth E. Chain

    Sol. Energ. Mater. 12 (2), 87-129 (1985).
    

1984

17. Optical Properties of Amorphous Germanium Films Prepared by CVD

    David D. Allred and J. A. Piontkowski

    Fifth International Conference on Thermoelectric Energy Conversion, (March 1984, Arlington, TX), 546-557 (1984).
    
18. Thermal Diffusivity by Modified Angstrom Technique

    N. Jackett, David D. Allred, T. H. Sein, and J. U. Trefny

    Fifth International Conference on Thermoelectric Energy Conversion, (March 1984, Arlington, TX), p 116-119 (1984).
    

1983

15. CVD a-Ge and a-Ge:X Films: Preparation and Properties

    David D. Allred and J. A. Piontkowski

    Fourth European Conference on Chemical Vapour Deposition
    

1981

14. Chemically vapor-deposited ZrB2 as a selective solar absorber

    E. Randich and D. D. Allred

    Thin Solid Films 83 (4), 393-398 (1981).
    
15. The Hydrogen Content of Multicomponent Amorphous Silicon Alloys by 19F Nuclear Reaction Analysis

    D. D. Allred, D. C. Booth, B. R. Appleton, P. D. Miller, C. D. Moak, J. P. F. Sellschop, C. W. White, and A. L. Wintenberg

    IEEE Trans. Nucl. Sci. 28 (2), 1838-1840 (1981).
    

1980

12. Retarding crystallization of CVD amorphous silicon by alloying

    D.C. Booth, D. D. Allred, and B. O. Seraphin

    J. Non-Cryst. Solids 35-36 (1), 213-218 (1980).
    

1970s

1979

11. Stabilized CVD amorphous silicon for high temperature photothermal solar energy conversion

    D. C. Booth, D. D. Allred, and B. O. Seraphin

    Sol. Energ. Mater. 2 (1), 107-124 (1979).
    
12. Selective Surfaces by Chemical Vapor Deposition

    David D. Allred

    Second Annual Coating for Solar Collectors Symposium
    
13. Optical properties and structure of amorphous silicon films prepared by CVD

    M. Janai, D. D. Allred, D. C. Booth, and B. O. Seraphin

    Sol. Energ. Mater. 1, 11-27 (1979).
    
14. Stabilized cvd amorphous silicon for high-temperature photothermal solar-energy conversion

    D.C. Booth, D.D. Allred, and B. O. Seraphin

    Sol. Energ. Mater. 2 (1), 107-124 (1979).
    

1978

7. Chemical Vapor Deposited Molybdenum Films For Use In Photothermal Conversion'

   G. E. Carver, D. D. Allred, and B. O. Seraphin

   Proc. SPIE 0161, 66-71 (1978).
   
8. Chemical Vapor Deposited Amorphous Silicon For Use In Photothermal Conversion

   D. C. Booth, M. Janai, G. Weiser, D. D. Allred, and B. O. Seraphin

   Proc. SPIE 0161, 72-77 (1978).
   
9. Application of nuclear-reactions for quantitative hydrogen analysis in a variety of different materials problems

   G. J. Clark, C. W. White, D. D. Allred, B. R. Appleton, F. B. Koch, and C. W. Magee

   Nucl. Instr. Meth. 149 (1-3), 9-18 (1978).
   
10. Profiling hydrogen in materials using ion-beams

    J.F. Ziegler, C.P. Wu, P. Williams, C. W. White, B. Terreault, B. M. U. Scherzer, … and D. D. Allred (20 other authors)

    Nucl. Instr. Meth. 149 (1-3), 19-39 (1978).
    
11. Hydrogen concentration profiles in quartz determined by a nuclear-reaction technique

    G. J. Clark, C. W. White, D. D. Allred, B. R. Appleton, and I. S. T. Tsong

    Phys. Chem. Miner. 3 (2), 199-211 (1978).

1977

2. The use of nuclear reactions and SIMS for quantitative depth profiling of hydrogen in amorphous silicon

   G. J. Clark, C. W. White, D. D. Allred, B. R. Appleton, C. W. Magee, and D. E. Carlson

   Appl. Phys. Lett. 31, 582-585 (1977).
   

1972

1. β-Delayed Proton Decay of C9

   John E. Esterl, David Allred, J. C. Hardy, R. G. Sextro, and Joseph Cerny

   Phys. Rev. C 6 (1), 373-375 (1972).
   

^‡Undergraduate Student Author

^†Graduate Student Author