Department Publications

2000s

2008

  1. Eliminating carbon contamination on oxidized Si surfaces using a VUV excimer lamp
    Elisabeth (Liz) Strein† and David Allred
    Thin Solid Films 517 (3), 1011-1015 (2008).
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  2. Eliminating adventitious carbon contamination on SiO2 using a UV excimer lamp
    E. Strein†, D. Allred, and R. S. Turley
    Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
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  3. Nanoscale Characterization of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy
    Guillermo Acosta†, Richard Vanfleet, David D. Allred, and R. S. Turley
    Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
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  4. Extreme-ultraviolet polarimeter utilizing laser-generated high-order harmonics
    Nicole Brimhall†, Matthew Turner‡, Nicholas Herrick‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross
    Rev. Sci. Instrum. 79 (10), 103108 (2008).
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  5. Determining the refractive index in the extreme ultraviolet using Kramers-Kronig on thin-film scandium oxide transmission data
    Jacqualine Jackson Butterfield† and David D. Allred
    J. Utah Acad. Sci. 85, 203-211 (2008).
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‡Undergraduate Student Author

†Graduate Student Author