Department Publications

2000s

2006

7. Determining indices of refraction for ThO2 thin films sputtered under different bias voltages from 1.2 to 6.5 eV by spectroscopic ellipsometry

   William R. Evans^† and David D. Allred

   Thin Solid Films 515 (3), 847-853 (2006).
   
8. Simultaneous Reflection and Transmission Measurements from Coated Diodes to Determine the Optical Constants of Thin Films in the Extreme Ultraviolet

   D. D. Allred, G. A. Acosta^†, N. Farnsworth-Brimhall^†, and R. S. Turly

   Society of Vacuum Coaters, 2006 Technical Conference Proceedings, Optical Coating (April 2006, Washington, DC). Proc. SVC 2006, 314-325 (2006).
   
9. Thorium dioxide thin films in the extreme ultraviolet

   Nicole F. Brimhall^†, Amy B. Grigg^†, R. Steven Turley, and David D. Allred

   Proc. SPIE 6317, 631711 (2006).
   
10. Understanding DC-bias sputtered thorium oxide thin films useful in EUV optics

    William R. Evans^†, Sarah C. Barton, Michael Clemens^†, and David D. Allred

    Advances in X-Ray/EUV Optics, Components, and Applications, (August 2006, San Diego, CA).  Proc. SPIE 6317, 631711 (2006).
    
11. Intermediate Martian Atmospheric Study and Demonstration

    Donovan Chipman^‡, Andrew Ning^‡, and David Allred

    SpaceOps 2006 Conference, (June 2006, Rome, Italy)
    
12. PECVD growth of Six:Ge1-x films for high speed devices and MEMS

    Srinivasan Kannan, Craig Taylor, and David Allred

    J. Non-Cryst. Solids 352 (9-20), 1272-1274 (2006).
    
13. Thorium-Based Thin Films as Highly Reflective Mirrors in the EUV

    Jed E. Johnson^†, David D. Allred, R. Steven Turley, William R. Evans^†, and Richard L. Sandberg^‡

    2005 Materials Research Society Fall Meeting, Symposium JJ – Actinides 2005 – Basic Science, Applications and Technology, (November 2005, Boston, MA). MRS Proc. 893, 207-214 (2006).
    

^‡Undergraduate Student Author

^†Graduate Student Author