Department Publications

1990s

1992

6. Using thin-film stress to produce precision, figured X-ray optics

   F. Yuan^†, Y. Shi^†, L. V. Knight, R. T. Perkins^†, and D. D. Allred

   Thin Solid Films 220 (1-2), 284-288 (1992).
   
7. Raman Spectroscopic Analysis of Mo/Si Multilayers

   David D. Allred, Ming Cai^†, Qi Wang^†, Dorian M. Hatch, and A. Reyes-Mena

   J. X-ray Sci. Technol. 3 (3), 222-228 (1992).
   
8. Multilayer phase diffraction gratings modeled as a structure in three dimensions

   Douglas P. Hansen ^†, Arturo Reyes-Mena , John R. Colton, Larry V. Knight, and David D. Allred

   Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (July 1992, San Diego, CA). Proc. SPIE 1742, 476 (1992).
   
9. X-ray diode using a silicon field-emission photocathode

   Wael I. Karain^†, Larry V. Knight, David D. Allred, and Arturo Reyes-Mena

   Soft X-Ray Microscopy, (July 1992, San Diego, CA). Proc. SPIE 1741, 12-18 (1992).
   
10. Manufacturing of atomically sharp silicon tips and their use as photocathodes

    W. I. Karain^†, Larry V. Knight, David D. Allred, and A. Reyes-Mena

    J. Utah Acad. Sci. 69, 257-272 (1992).
    
11. Characterization of as‐prepared and annealed W/C multilayer thin films

    J. Gonzalez-Hernandez, B. S. Chao, D. A. Pawlik, D. D. Allred, and Qi Wang^†

    J. Vac. Sci. Technol. A 10 (1), 145-151 (1992).
    

^‡Undergraduate Student Author

^†Graduate Student Author