Department Publications

2000s

2005

2. A Technique for Measuring the Thin Film Thickness of Ultrathin Metallic Thin Films, 4-20 nm, using Atomic Force Microscopy

   Guillermo Acosta^†, David D. Allred, and Robert C. Davis

   Summer 2005 SVC Bulletin, 34-38 (2005).
   
3. Determining Composition of Thin Films of Uranium Oxide by X-Ray Photoelectron Spectroscopy

   Kristi Adamson^‡, Shannon Lunt^†, Richard Sandberg^†, Elke Jackson^‡, David Allred, and R. Steven Turley

   J. Utah Acad. Sci. 82, 176-186 (2005).
   

^‡Undergraduate Student Author

^†Graduate Student Author