Department Publications

2023

2. Microstructure quantification of oblique angle sputtered porous a-Si thin films as a basis for structure-property relations of solid phase microextraction coatings

   Behnam Moeini^†, David T. Fullwood, Paul Minson, Daniel Shollenberger, David S. Bell, Morris D. Argyle, Richard Vanfleet, and Matthew R. Linford

   Surf. Coat. Technol. 473, 130014 (2023).
   
3. Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models

   Paul S. Minson, Felipe Rivera, and Richard Vanfleet

   Ultramicroscopy 246, 113684 (2023).
   

^‡Undergraduate Student Author

^†Graduate Student Author