2011
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FIB TEM Cross-Section Sample Preparation of Thin Metal Films Deposited on Polymer SubstratesMicroscopy and Microanalysis 2011, (Nashville, TN, August 2011). Microsc. Microanal. 17 (S2), 638-639 (2011).
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Opt. Eng. 50 (1), 015201 (2011).
‡Undergraduate Student Author
†Graduate Student Author