Department Publications

1990s

1992

• Using thin-film stress to produce precision, figured X-ray optics

  F. Yuan^†, Y. Shi^†, L. V. Knight, R. T. Perkins^†, and D. D. Allred

  Thin Solid Films 220 (1-2), 284-288 (1992).
  
• High-precision measurement of electrical resistivity of nickel near the ferromagnetic phase transition at high pressure

  D. L. Decker and Wei Chen^†

  Phys. Rev. B 46 (13), 8237-8243 (1992).
  
• Raman Spectroscopic Analysis of Mo/Si Multilayers

  David D. Allred, Ming Cai^†, Qi Wang^†, Dorian M. Hatch, and A. Reyes-Mena

  J. X-ray Sci. Technol. 3 (3), 222-228 (1992).
  
• Multilayer phase diffraction gratings modeled as a structure in three dimensions

  Douglas P. Hansen ^†, Arturo Reyes-Mena , John R. Colton, Larry V. Knight, and David D. Allred

  Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (July 1992, San Diego, CA). Proc. SPIE 1742, 476 (1992).
  
• X-ray diode using a silicon field-emission photocathode

  Wael I. Karain^†, Larry V. Knight, David D. Allred, and Arturo Reyes-Mena

  Soft X-Ray Microscopy, (July 1992, San Diego, CA). Proc. SPIE 1741, 12-18 (1992).
  
• Manufacturing of atomically sharp silicon tips and their use as photocathodes

  W. I. Karain^†, Larry V. Knight, David D. Allred, and A. Reyes-Mena

  J. Utah Acad. Sci. 69, 257-272 (1992).
  
• Pressure dependence of the thermal-conductivity of pyrophyllite to 40-kbar

  Wei Chen^† and D. L. Decker

  J. Appl. Phys. 71 (6), 2624-2627 (1992).
  
• Characterization of as‐prepared and annealed W/C multilayer thin films

  J. Gonzalez-Hernandez, B. S. Chao, D. A. Pawlik, D. D. Allred, and Qi Wang^†

  J. Vac. Sci. Technol. A 10 (1), 145-151 (1992).
  
• A Comparison of Fossilized Dinosaur Bone and the Surrounding Rock Using PIXE Analysis

  D. W. Neilsen^†, L. B. Rees, N. F. Mangelson, and M. W. Hill

  Int. J. PIXE 2 (3), 413-416 (1992).
  

^‡Undergraduate Student Author

^†Graduate Student Author