2000s
2005
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Phys. Rev. Lett. 95 (23), 235001 (2005).
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Phys. Plasmas 12 (12), 123501 (2005).
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Rev. Sci. Instrum. 76 (12), 123110 (2005).
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Astron. J. 130 (6), 2876-2883 (2005).
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INTER-NOISE and NOISE-CON Congress and Conference Proceedings, NoiseCon05, pp. 589-594, (Minneapolis MN, October 2005).
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J. Am. Soc. Mass Spectrom. 16 (10), 1575-1582 (2005).
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Mol. Simul. 31 (12), 859-864 (2005).
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ASME 2005 International Design Engineering Technical Conferences and Computers and Information in Engineering, Volume 1: 20th Biennial Conference on Mechanical Vibration and Noise, Parts A, B, and C. (Long Beach, CA, September 2005).
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Publ. Astron. Soc. Pac. 117 (835), 955-966 (2005).
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Appl. Optics 44 (22), 4639-4647 (2005).
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Chemomechanical Silicon Surface Modification: Chemistry, Patterning at the Nanometer and Micron Scales, and an Application (MALDI).Lithogragphy and Patterningin Nanolithography and patterning techniques in microelectronics, David G. Bucknall ed., Woodhead-Publishing, Cambridge England (2005).
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Summer 2005 SVC Bulletin, 34-38 (2005).
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J. Phys.: Condens. Matter 17 (21), L209-L213 (2005).
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Phys. Rev. B 71 (23), 235101 (2005).
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Phys. Rev. B 71 (18), 184109 (2005).
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Inorg. Chem. 44 (10), 3738-3745 (2005).
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Phys. Rev. A 71 (4), 043406 (2005).
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Nano Lett. 5 (4), 571-577 (2005).
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Determining Composition of Thin Films of Uranium Oxide by X-Ray Photoelectron SpectroscopyJ. Utah Acad. Sci. 82, 176-186 (2005).
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J. Am. Chem. Soc. 127 (9), 2828-2829 (2005).
‡Undergraduate Student Author
†Graduate Student Author