Department Publications

2000s

2008

5. Eliminating adventitious carbon contamination on SiO2 using a UV excimer lamp

   E. Strein^†, D. Allred, and R. S. Turley

   Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
   
6. Nanoscale Characterization of Thin Film Coatings Using Annular Dark Field Scanning Transmission Electron Microscopy

   Guillermo Acosta^†, Richard Vanfleet, David D. Allred, and R. S. Turley

   Society of Vacuum Coaters, 2008 Technical Conference, (April 2008, Chicago, IL), 448-442 (2008). 
   
7. Extreme-ultraviolet polarimeter utilizing laser-generated high-order harmonics

   Nicole Brimhall^†, Matthew Turner^‡, Nicholas Herrick^‡, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross

   Rev. Sci. Instrum. 79 (10), 103108 (2008).
   
8. Surface Roughness of Thin Films

   R. Steven Turley, Elise Martin^‡, and Jed Johnson^†

   J. Utah Acad. Sci. 84, 161-171 (2008).
   
9. Installation of a Grazing Incidence Monochromator for use in the Extreme Ultraviolet

   Sarah B. Mitchell^‡ and R. Steven Turley

   J. Utah Acad. Sci. 84, 154-160 (2008).
   

^‡Undergraduate Student Author

^†Graduate Student Author