2010s
2011
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ASME 2011 International Mechanical Engineering Congress and Exposition, (November 2011, Denver, CO)
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FIB TEM Cross-Section Sample Preparation of Thin Metal Films Deposited on Polymer SubstratesMicroscopy and Microanalysis 2011, (Nashville, TN, August 2011). Microsc. Microanal. 17 (S2), 638-639 (2011).
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Nanosci. Nanotechnol. Lett. 3 (4), 451-457 (2011).
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VIII International Conference ION 2010, (June 2010, Kazimierz Dolny, Poland) Acta Phys. Pol. A 120 (1), 196-199 (2011).
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Microsc. Microanal. 17 (3), 398-402 (2011).
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Microsc. Microanal. 17 (3), 403-409 (2011).
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Adv. Funct. Mater. 21 (6), 1132-1139 (2011).
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J. Vac. Sci. Technol. A 29, 021017 (2011).
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Opt. Eng. 50 (1), 015201 (2011).
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International Conference on Extended Defects in Semiconductors 2010 (June 2010, Brighton, United Kingdom). J. Phys.: Conf. Ser. 281 012030.
‡Undergraduate Student Author
†Graduate Student Author