Department Publications

2020s

2023

4. Miniaturized short-wavelength infrared spectrometer for diffuse light applications

   Tyler Westover^†, Zach Westhoff^‡, Sharisse Poff^†, Nick Morrill^‡, David Miller, Shiuh-Hua W. Chiang, Richard Vanfleet, and Robert C. Davis

   Adv. Photonics Nexus 2 (6), 066003 (2023).
   
5. Microstructure quantification of oblique angle sputtered porous a-Si thin films as a basis for structure-property relations of solid phase microextraction coatings

   Behnam Moeini^†, David T. Fullwood, Paul Minson, Daniel Shollenberger, David S. Bell, Morris D. Argyle, Richard Vanfleet, and Matthew R. Linford

   Surf. Coat. Technol. 473, 130014 (2023).
   
6. Determining local modulus and strength of heterogeneous films by force–deflection mapping of microcantilevers

   Kyle Larsen^†, Stefan Lehnardt^‡, Bryce Anderson^‡, Joseph Rowley^†, Richard Vanfleet, and Robert Davis

   Rev. Sci. Instrum. 94 (3), 033904 (2023).
   
7. Quantitative STEM: A method for measuring temperature and thickness effects on thermal diffuse scattering using STEM/EELS, and for testing electron scattering models

   Paul S. Minson, Felipe Rivera, and Richard Vanfleet

   Ultramicroscopy 246, 113684 (2023).
   

^‡Undergraduate Student Author

^†Graduate Student Author