Student Thesis Archive

Advisor:

2022

2021

2020

2019

2018

2017

2015

2014

2013

2012

2011

2010

2009

2008

2007

2006

  • S. Andrew Ning, “Creation of an Intermediate Environment and Utilizing Switchable Microwave Absorbent Material to Aid in Performing Work on Mars,” Advisor: David Allred (Honors Thesis, August 2006).

2005

  • William Ray Evans, “Determining Optical Constants for ThO2 Thin Films Spluttered under Different Bias Voltages from 1.2 to 6.5 eV by Spectroscopic Ellipsometry,” Advisor: David Allred (Honors Thesis, January 2005).

2004

  • Guillermo Antonio Acosta, “Developing a Technique for measuring Thickness of Thin Films, From 5 to 15 Nanometers, Using Atomic Force Microscopy ,” Advisor: David Allred (Masters Thesis, August 2004).
  • Kristi Adamson, “Determining Chemical Composition of Sputtered Uranium Oxide Thin Films through X-Ray Photoelectron Spectroscopy,” Advisor: David Allred (Senior Thesis, April 2004).
  • Paul Archer, “Determining Favorable Conditions for Endolithic Growth: UV Protection and Desiccation Prevention,” Advisor: David Allred (Senior Thesis, June 2004).
  • Luke Bissell, “Determining Ruthenium's Optical Constants in the Spectral Range 11-14 NM,” Advisor: David Allred (Senior Thesis, August 2004).
  • Jedediah Edward Jensen Johnson, “Thorium Based Mirrors for High Reflectivity in the EUV,” Advisor: David Allred (Honors Thesis, August 2004).
  • Richard Sandberg, “Optical Applications of Uranium Thin-Film Compounds for the Extreme Ultraviolet and Soft X-Ray Region,” Advisor: David Allred (Senior Thesis, August 2004).

2003

2001

  • Joseph S. Choi, “In Situ Ellipsometry of Surfaces in an Ultrahigh Vacuum Thin Film Deposition Chamber,” Advisor: David Allred (Honors Thesis, June 2001).
  • Cort Johnson, “Developing an Improved Extreme Ultraviolet Filter,” Advisor: David Allred (Senior Thesis, April 2001).
  • Matthew B Squires, “The Measurment (58.4-164.0 nm) and Analysis (40.0- 600.0 nm) of the Atom Scattering Factors of Diamond and Graphite ,” Advisor: David Allred (Masters Thesis, August 2001).

1999

  • Matthew B. Squires, “On Determining the Optical Constants of Sputtered U and a-Si at 304 and 484 Å,” Advisor: David Allred (Honors Thesis, March 1999).

1998

  • Pavel Leonidovich Brovkin, “The Physics of Low-Capacitance JFETs,” Advisor: David Allred (Masters Thesis, April 1998).
  • Adam Fennimore, “Morphology and Oxidation of U/Al and UN/Al Multilayer MIrrors,” Advisor: David Allred (Honors Thesis, February 1998).

1996

  • Gregory B. Thompson, “Reactive Gas Sputtering of Lithium Compound Thin Films,” Advisor: David Allred (Senior Thesis, June 1996).

1993

  • Ming Cai, “The Characterization of Mo/Si Soft X-Ray Multilayers by Raman Spectrpscopy and Other Techniques,” Advisor: David Allred (PhD Dissertation, December 1993).

1991

  • Cheryl Barnett Davis, “Deep-Level Photoluminescience of ZNxCd1-xTe,” Advisor: David Allred (Masters Thesis, December 1991).
  • Fang Yuan, “Characterization of Boron Films Prepared by Chemical Vapor Deposition and their Applications in X-Ray Imaging,” Advisor: David Allred (PhD Dissertation, December 1991).